Liang Dai, Huiyun Li, Guoqing Xu, Liying Xiong. A Statistical Model to Predict Success Rate of Ion Fault Injection Attacks for Cryptographic ICs. In Tenth International Conference on Computational Intelligence and Security, CIS 2014, Kunming, Yunnan, China, November 15-16, 2014. pages 430-434, IEEE Computer Society, 2014. [doi]
@inproceedings{DaiLXX14,
title = {A Statistical Model to Predict Success Rate of Ion Fault Injection Attacks for Cryptographic ICs},
author = {Liang Dai and Huiyun Li and Guoqing Xu and Liying Xiong},
year = {2014},
doi = {10.1109/CIS.2014.27},
url = {http://doi.ieeecomputersociety.org/10.1109/CIS.2014.27},
researchr = {https://researchr.org/publication/DaiLXX14},
cites = {0},
citedby = {0},
pages = {430-434},
booktitle = {Tenth International Conference on Computational Intelligence and Security, CIS 2014, Kunming, Yunnan, China, November 15-16, 2014},
publisher = {IEEE Computer Society},
isbn = {978-1-4799-7434-4},
}