Liang Dai, Huiyun Li, Guoqing Xu, Liying Xiong. A Statistical Model to Predict Success Rate of Ion Fault Injection Attacks for Cryptographic ICs. In Tenth International Conference on Computational Intelligence and Security, CIS 2014, Kunming, Yunnan, China, November 15-16, 2014. pages 430-434, IEEE Computer Society, 2014. [doi]
Abstract is missing.