Foster F. Dai, Charles E. Stroud, Dayu Yang. Automatic linearity and frequency response tests with built-in pattern generator and analyzer. IEEE Trans. VLSI Syst., 14(6):561-572, 2006. [doi]
@article{DaiSY06,
title = {Automatic linearity and frequency response tests with built-in pattern generator and analyzer},
author = {Foster F. Dai and Charles E. Stroud and Dayu Yang},
year = {2006},
doi = {10.1109/TVLSI.2006.878201},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2006.878201},
tags = {testing, e-science},
researchr = {https://researchr.org/publication/DaiSY06},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {14},
number = {6},
pages = {561-572},
}