Mingzhi Dai, Kinleong Yap. Observation and mechanism explanation of the parasitic charge pumping current. In Microelectronics Reliability. pages 1915-1919, 2010. [doi]
@inproceedings{DaiY10,
title = {Observation and mechanism explanation of the parasitic charge pumping current},
author = {Mingzhi Dai and Kinleong Yap},
year = {2010},
doi = {10.1016/j.microrel.2010.07.004},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.004},
researchr = {https://researchr.org/publication/DaiY10},
cites = {0},
citedby = {0},
pages = {1915-1919},
booktitle = {Microelectronics Reliability},
}