Ashley Dale, Lauren A. Christopher, William Reindl, Edwin Sanchez, Sam Brunes, Will Bickel, Jasmine Martin, Albert William. All patched up: effective integration of real and synthetic features into a single image for object detection. In 52nd IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2023, St. Louis, MO, USA, September 27-29, 2023. pages 1-7, IEEE, 2023. [doi]
Abstract is missing.