Julien Dalmasso, Marie-Lise Flottes, Bruno Rouzeyre. Fitting ATE Channels with Scan Chains: a Comparison between a Test Data Compression Technique and Serial Loading of Scan Chains. In Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006), 17-19 January 2006, Kuala Lumpur, Malaysia. pages 295-300, IEEE Computer Society, 2006. [doi]
Abstract is missing.