Marcello Dalpasso, Michele Favalli, Piero Olivo. Test pattern generation for I/sub DDQ/: increasing test quality. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 304-309, IEEE Computer Society, 1995. [doi]
@inproceedings{DalpassoFO95,
title = {Test pattern generation for I/sub DDQ/: increasing test quality},
author = {Marcello Dalpasso and Michele Favalli and Piero Olivo},
year = {1995},
url = {http://csdl.computer.org/comp/proceedings/vts/1995/7000/00/70000304abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/DalpassoFO95},
cites = {0},
citedby = {0},
pages = {304-309},
booktitle = {13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA},
publisher = {IEEE Computer Society},
}