A 130 nm Event-Driven Voltage and Temperature Insensitive Capacitive ROC

Alessia Damilano, Marco Crepaldi, Paolo Motto Ros, Danilo Demarchi. A 130 nm Event-Driven Voltage and Temperature Insensitive Capacitive ROC. In 17th Euromicro Conference on Digital System Design, DSD 2014, Verona, Italy, August 27-29, 2014. pages 663-666, IEEE, 2014. [doi]

@inproceedings{DamilanoCRD14,
  title = {A 130 nm Event-Driven Voltage and Temperature Insensitive Capacitive ROC},
  author = {Alessia Damilano and Marco Crepaldi and Paolo Motto Ros and Danilo Demarchi},
  year = {2014},
  doi = {10.1109/DSD.2014.68},
  url = {http://dx.doi.org/10.1109/DSD.2014.68},
  researchr = {https://researchr.org/publication/DamilanoCRD14},
  cites = {0},
  citedby = {0},
  pages = {663-666},
  booktitle = {17th Euromicro Conference on Digital System Design, DSD 2014, Verona, Italy, August 27-29, 2014},
  publisher = {IEEE},
}