Reliability of 70 nm metamorphic HEMTs

M. Dammann, A. Leuther, RĂ¼diger Quay, M. Meng, H. Konstanzer, W. Jantz, Michael Mikulla. Reliability of 70 nm metamorphic HEMTs. Microelectronics Reliability, 44(6):939-943, 2004. [doi]

Abstract

Abstract is missing.