You Better Look Twice: a new perspective for designing accurate detectors with reduced computations - researchr publication authors

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Alexandra Dana, Maor Shutman, Yotam Perlitz, Ran Vitek, Tomer Peleg, Roy J. Jevnisek. You Better Look Twice: a new perspective for designing accurate detectors with reduced computations. In 32nd British Machine Vision Conference 2021, BMVC 2021, Online, November 22-25, 2021. pages 257, BMVA Press, 2021. [doi]

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