You Better Look Twice: a new perspective for designing accurate detectors with reduced computations

Alexandra Dana, Maor Shutman, Yotam Perlitz, Ran Vitek, Tomer Peleg, Roy J. Jevnisek. You Better Look Twice: a new perspective for designing accurate detectors with reduced computations. In 32nd British Machine Vision Conference 2021, BMVC 2021, Online, November 22-25, 2021. pages 257, BMVA Press, 2021. [doi]

@inproceedings{DanaSPVPJ21,
  title = {You Better Look Twice: a new perspective for designing accurate detectors with reduced computations},
  author = {Alexandra Dana and Maor Shutman and Yotam Perlitz and Ran Vitek and Tomer Peleg and Roy J. Jevnisek},
  year = {2021},
  url = {https://www.bmvc2021-virtualconference.com/assets/papers/0425.pdf},
  researchr = {https://researchr.org/publication/DanaSPVPJ21},
  cites = {0},
  citedby = {0},
  pages = {257},
  booktitle = {32nd British Machine Vision Conference 2021, BMVC 2021, Online, November 22-25, 2021},
  publisher = {BMVA Press},
}