Omkar Dandekar, Khan M. Siddiqui, Vivek Walimbe, Raj Shekhar. Image registration accuracy with low-dose CT: how low can we go?. In Proceedings of the 2006 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Arlington, VA, USA, 6-9 April 2006. pages 502-505, IEEE, 2006. [doi]
Abstract is missing.