Francesca Danesin, Augusto Tazzoli, Franco Zanon, Gaudenzio Meneghesso, Enrico Zanoni, Antonio Cetronio, Claudio Lanzieri, Simone Lavanga, Marco Peroni, Paolo Romanini. Thermal storage effects on AlGaN/GaN HEMT. Microelectronics Reliability, 48(8-9):1361-1365, 2008. [doi]
@article{DanesinTZMZCLLPR08,
title = {Thermal storage effects on AlGaN/GaN HEMT},
author = {Francesca Danesin and Augusto Tazzoli and Franco Zanon and Gaudenzio Meneghesso and Enrico Zanoni and Antonio Cetronio and Claudio Lanzieri and Simone Lavanga and Marco Peroni and Paolo Romanini},
year = {2008},
doi = {10.1016/j.microrel.2008.07.008},
url = {http://dx.doi.org/10.1016/j.microrel.2008.07.008},
researchr = {https://researchr.org/publication/DanesinTZMZCLLPR08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {8-9},
pages = {1361-1365},
}