Francesca Danesin, Augusto Tazzoli, Franco Zanon, Gaudenzio Meneghesso, Enrico Zanoni, Antonio Cetronio, Claudio Lanzieri, Simone Lavanga, Marco Peroni, Paolo Romanini. Thermal storage effects on AlGaN/GaN HEMT. Microelectronics Reliability, 48(8-9):1361-1365, 2008. [doi]
Abstract is missing.