A Novel Reliability-Enhanced Dual Over-Temperature Protection Circuit With Delayed Thermal Restart for Power ICs

Jianying Dang, Xiaowu Cai, Longli Pan, Liang Shan 0015, Yu Lu, Yafei Xie, Xupeng Wang, Shiping Wang, Bo Li 0051. A Novel Reliability-Enhanced Dual Over-Temperature Protection Circuit With Delayed Thermal Restart for Power ICs. IEEE Trans. Circuits Syst. II Express Briefs, 71(3):1471-1475, March 2024. [doi]

@article{DangCPSLXWWL24,
  title = {A Novel Reliability-Enhanced Dual Over-Temperature Protection Circuit With Delayed Thermal Restart for Power ICs},
  author = {Jianying Dang and Xiaowu Cai and Longli Pan and Liang Shan 0015 and Yu Lu and Yafei Xie and Xupeng Wang and Shiping Wang and Bo Li 0051},
  year = {2024},
  month = {March},
  doi = {10.1109/TCSII.2023.3322472},
  url = {https://doi.org/10.1109/TCSII.2023.3322472},
  researchr = {https://researchr.org/publication/DangCPSLXWWL24},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Circuits Syst. II Express Briefs},
  volume = {71},
  number = {3},
  pages = {1471-1475},
}