A Novel Reliability-Enhanced Dual Over-Temperature Protection Circuit With Delayed Thermal Restart for Power ICs

Jianying Dang, Xiaowu Cai, Longli Pan, Liang Shan 0015, Yu Lu, Yafei Xie, Xupeng Wang, Shiping Wang, Bo Li 0051. A Novel Reliability-Enhanced Dual Over-Temperature Protection Circuit With Delayed Thermal Restart for Power ICs. IEEE Trans. Circuits Syst. II Express Briefs, 71(3):1471-1475, March 2024. [doi]

Abstract

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