Deformation Monitoring Based on Millimeter-Wave Beam Scanning Algorithm

Xiaolei Dang, Kaikai Liu, Yiwen Wang, Zengshan Tian. Deformation Monitoring Based on Millimeter-Wave Beam Scanning Algorithm. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2024, Glasgow, United Kingdom, May 20-23, 2024. pages 1-6, IEEE, 2024. [doi]

Abstract

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