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2D-PPC: A single-correction multiple-detection method for Through-Silicon-Via Faults

Khanh N. Dang, Michael Conrad Meyer, Akram Ben Ahmed, Abderazek Ben Abdallah, Xuan-Tu Tran. 2D-PPC: A single-correction multiple-detection method for Through-Silicon-Via Faults. In 2019 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2019, Bangkok, Thailand, November 11-14, 2019. pages 109-112, IEEE, 2019. [doi]

Authors

Khanh N. Dang

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Michael Conrad Meyer

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Akram Ben Ahmed

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Abderazek Ben Abdallah

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Xuan-Tu Tran

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