R. Gary Daniels, William C. Bruce. Built-In Self-Test Trends in Motorola Microprocessors. IEEE Design & Test of Computers, 2(2):64-71, 1985. [doi]
@article{DanielsB85,
title = {Built-In Self-Test Trends in Motorola Microprocessors},
author = {R. Gary Daniels and William C. Bruce},
year = {1985},
doi = {10.1109/MDT.1985.294865},
url = {https://doi.org/10.1109/MDT.1985.294865},
researchr = {https://researchr.org/publication/DanielsB85},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {2},
number = {2},
pages = {64-71},
}