A Statistical Approach to Characterizing and Testing Functionalized Nanowires - researchr publication authors

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James Dardig, Haralampos-G. D. Stratigopoulos, Eric Stern, Mark Reed, Yiorgos Makris. A Statistical Approach to Characterizing and Testing Functionalized Nanowires. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 267-274, IEEE Computer Society, 2008. [doi]

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