James Dardig, Haralampos-G. D. Stratigopoulos, Eric Stern, Mark Reed, Yiorgos Makris. A Statistical Approach to Characterizing and Testing Functionalized Nanowires. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 267-274, IEEE Computer Society, 2008. [doi]
@inproceedings{DardigSSRM08,
title = {A Statistical Approach to Characterizing and Testing Functionalized Nanowires},
author = {James Dardig and Haralampos-G. D. Stratigopoulos and Eric Stern and Mark Reed and Yiorgos Makris},
year = {2008},
doi = {10.1109/VTS.2008.19},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.19},
tags = {testing, systematic-approach},
researchr = {https://researchr.org/publication/DardigSSRM08},
cites = {0},
citedby = {0},
pages = {267-274},
booktitle = {26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA},
publisher = {IEEE Computer Society},
}