Sandhitsu R. Das, Brian B. Avants, Murray Grossman, James C. Gee. Measuring Cortical Thickness Using An Image Domain Local Surface Model And Topology Preserving Segmentation. In IEEE 11th International Conference on Computer Vision, ICCV 2007, Rio de Janeiro, Brazil, October 14-20, 2007. pages 1-8, IEEE, 2007. [doi]
Abstract is missing.