P. S. Das, A. Biswas. Charge trapping and reliability characteristics of ultra-thin HfYO::x:: films on n-GaAs substrates. In Microelectronics Reliability. pages 1924-1930, 2010. [doi]
@inproceedings{DasB10-6,
title = {Charge trapping and reliability characteristics of ultra-thin HfYO::x:: films on n-GaAs substrates},
author = {P. S. Das and A. Biswas},
year = {2010},
doi = {10.1016/j.microrel.2010.07.009},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.009},
tags = {reliability},
researchr = {https://researchr.org/publication/DasB10-6},
cites = {0},
citedby = {0},
pages = {1924-1930},
booktitle = {Microelectronics Reliability},
}