Debayan Das, Josef Danial, Anupam Golder, Nirmoy Modak, Shovan Maity, Baibhab Chatterjee, Dong-Hyun Seo, Muya Chang, Avinash Varna, Harish K. Krishnamurthy, Sanu Mathew, Santosh Ghosh, Arijit Raychowdhury, Shreyas Sen. EM and Power SCA-Resilient AES-256 Through >350× Current-Domain Signature Attenuation and Local Lower Metal Routing. J. Solid-State Circuits, 56(1):136-150, 2021. [doi]
@article{DasDGMMCSCVKMGR21,
title = {EM and Power SCA-Resilient AES-256 Through >350× Current-Domain Signature Attenuation and Local Lower Metal Routing},
author = {Debayan Das and Josef Danial and Anupam Golder and Nirmoy Modak and Shovan Maity and Baibhab Chatterjee and Dong-Hyun Seo and Muya Chang and Avinash Varna and Harish K. Krishnamurthy and Sanu Mathew and Santosh Ghosh and Arijit Raychowdhury and Shreyas Sen},
year = {2021},
doi = {10.1109/JSSC.2020.3032975},
url = {https://doi.org/10.1109/JSSC.2020.3032975},
researchr = {https://researchr.org/publication/DasDGMMCSCVKMGR21},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {56},
number = {1},
pages = {136-150},
}