Syndrome signature in output compaction for VLSI BIST

Sunil R. Das, N. Goel, Wen-Ben Jone, A. R. Nayak. Syndrome signature in output compaction for VLSI BIST. In 9th International Conference on VLSI Design (VLSI Design 1996), 3-6 January 1996, Bangalore, India. pages 337-338, IEEE Computer Society, 1996. [doi]

Abstract

Abstract is missing.