On-Chip Measurement of Rise/Fall Gate Delay Using Reconfigurable Ring Oscillator

Bishnu Prasad Das, Hidetoshi Onodera. On-Chip Measurement of Rise/Fall Gate Delay Using Reconfigurable Ring Oscillator. IEEE Trans. on Circuits and Systems, 61-II(3):183-187, 2014. [doi]

Authors

Bishnu Prasad Das

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Hidetoshi Onodera

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