Bishnu Prasad Das, Hidetoshi Onodera. On-Chip Measurement of Rise/Fall Gate Delay Using Reconfigurable Ring Oscillator. IEEE Trans. on Circuits and Systems, 61-II(3):183-187, 2014. [doi]
@article{DasO14,
title = {On-Chip Measurement of Rise/Fall Gate Delay Using Reconfigurable Ring Oscillator},
author = {Bishnu Prasad Das and Hidetoshi Onodera},
year = {2014},
doi = {10.1109/TCSII.2013.2296118},
url = {http://dx.doi.org/10.1109/TCSII.2013.2296118},
researchr = {https://researchr.org/publication/DasO14},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {61-II},
number = {3},
pages = {183-187},
}