Sunil R. Das, Rochit Rajsuman. Guest editorial [Special section on innovations in VLSI automatic test equipment (ATEs)]. IEEE T. Instrumentation and Measurement, 52(5):1350-1352, 2003. [doi]
@article{DasR03,
title = {Guest editorial [Special section on innovations in VLSI automatic test equipment (ATEs)]},
author = {Sunil R. Das and Rochit Rajsuman},
year = {2003},
doi = {10.1109/TIM.2003.819774},
url = {http://dx.doi.org/10.1109/TIM.2003.819774},
tags = {testing},
researchr = {https://researchr.org/publication/DasR03},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {52},
number = {5},
pages = {1350-1352},
}