Revisiting response compaction in space for full-scan circuits with nonexhaustive test sets using concept of sequence characterization - researchr publication

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Sunil R. Das, Chittoor V. Ramamoorthy, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone, Mehmet Sahinoglu. Revisiting response compaction in space for full-scan circuits with nonexhaustive test sets using concept of sequence characterization. IEEE T. Instrumentation and Measurement, 54(5):1662-1677, 2005. [doi]

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