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Fault simulation and response compaction in full scan circuits using HOPE

Sunil R. Das, Chittoor V. Ramamoorthy, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone, Mehmet Sahinoglu. Fault simulation and response compaction in full scan circuits using HOPE. IEEE T. Instrumentation and Measurement, 54(6):2310-2328, 2005. [doi]

Authors

Sunil R. Das

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Chittoor V. Ramamoorthy

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Mansour H. Assaf

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Emil M. Petriu

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Wen-Ben Jone

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Mehmet Sahinoglu

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