Sunil R. Das, Chittoor V. Ramamoorthy, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone, Mehmet Sahinoglu. Fault simulation and response compaction in full scan circuits using HOPE. IEEE T. Instrumentation and Measurement, 54(6):2310-2328, 2005. [doi]
Abstract is missing.