Abhishek Das, Nur A. Touba. Layered-ECC: A Class of Double Error Correcting Codes for High Density Memory Systems. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{DasT19a, title = {Layered-ECC: A Class of Double Error Correcting Codes for High Density Memory Systems}, author = {Abhishek Das and Nur A. Touba}, year = {2019}, doi = {10.1109/VTS.2019.8758647}, url = {https://doi.org/10.1109/VTS.2019.8758647}, researchr = {https://researchr.org/publication/DasT19a}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019}, publisher = {IEEE}, isbn = {978-1-7281-1170-4}, }