Finite element simulation to improve the sensitivity of a MIT

Maral Heidary Dastjerdi, Olfa Kanoun, Jörg Himmel. Finite element simulation to improve the sensitivity of a MIT. In 12th IEEE International Multi-Conference on Systems, Signals & Devices, SSD 2015, Mahdia, Tunisia, March 16-19, 2015. pages 1-4, IEEE, 2015. [doi]

Abstract

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