Statistical Modeling of Pipeline Delay and Design of Pipeline under Process Variation to Enhance Yield in sub-100nm Technologies

Animesh Datta, Swarup Bhunia, Saibal Mukhopadhyay, Nilanjan Banerjee, Kaushik Roy. Statistical Modeling of Pipeline Delay and Design of Pipeline under Process Variation to Enhance Yield in sub-100nm Technologies. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 926-931, IEEE Computer Society, 2005. [doi]

Abstract

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