Exploiting Unused Spare Columns to Improve Memory ECC

Rudrajit Datta, Nur A. Touba. Exploiting Unused Spare Columns to Improve Memory ECC. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 47-52, IEEE Computer Society, 2009. [doi]

Authors

Rudrajit Datta

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Nur A. Touba

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