Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre. Low-cost phase noise testing of complex RF ICs using standard digital ATE. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-9, IEEE, 2014. [doi]
@inproceedings{David-GrignotAL14,
title = {Low-cost phase noise testing of complex RF ICs using standard digital ATE},
author = {Stephane David-Grignot and Florence Azaïs and Laurent Latorre and Francois Lefevre},
year = {2014},
doi = {10.1109/TEST.2014.7035301},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035301},
researchr = {https://researchr.org/publication/David-GrignotAL14},
cites = {0},
citedby = {0},
pages = {1-9},
booktitle = {2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4722-5},
}