Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre. Low-cost phase noise testing of complex RF ICs using standard digital ATE. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-9, IEEE, 2014. [doi]
Abstract is missing.