A deep neural network and Bayesian method based framework for all-terminal network reliability estimation considering degradation - researchr publication

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Alex Davila-Frias, Nita Yodo, Trung Le, Om Prakash Yadav. A deep neural network and Bayesian method based framework for all-terminal network reliability estimation considering degradation. Rel. Eng. & Sys. Safety, 229:108881, 2023. [doi]

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