J. S. Davis, David C. Keezer, O. Liboiron-Ladouceur, K. Bergman. Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 166-174, IEEE Computer Society, 2003. [doi]
@inproceedings{DavisKLB03,
title = {Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober},
author = {J. S. Davis and David C. Keezer and O. Liboiron-Ladouceur and K. Bergman},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630166abs.htm},
tags = {testing, C++},
researchr = {https://researchr.org/publication/DavisKLB03},
cites = {0},
citedby = {0},
pages = {166-174},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}