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Measuring Bias in AI Models: An Statistical Approach Introducing N-Sigma

Daniel DeAlcala, Ignacio Serna, Aythami Morales, Julian Fiérrez, Javier Ortega-Garcia. Measuring Bias in AI Models: An Statistical Approach Introducing N-Sigma. In Hossain Shahriar, Yuuichi Teranishi, Alfredo Cuzzocrea, Moushumi Sharmin, Dave Towey, A. K. M. Jahangir Alam Majumder, Hiroki Kashiwazaki, Ji-Jiang Yang, Michiharu Takemoto, Nazmus Sakib, Ryohei Banno, Sheikh Iqbal Ahamed, editors, 47th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2023, Torino, Italy, June 26-30, 2023. pages 1167-1172, IEEE, 2023. [doi]

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Daniel DeAlcala

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Ignacio Serna

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Aythami Morales

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Julian Fiérrez

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Javier Ortega-Garcia

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