Daniel DeAlcala, Ignacio Serna, Aythami Morales, Julian Fiérrez, Javier Ortega-Garcia. Measuring Bias in AI Models: An Statistical Approach Introducing N-Sigma. In Hossain Shahriar, Yuuichi Teranishi, Alfredo Cuzzocrea, Moushumi Sharmin, Dave Towey, A. K. M. Jahangir Alam Majumder, Hiroki Kashiwazaki, Ji-Jiang Yang, Michiharu Takemoto, Nazmus Sakib, Ryohei Banno, Sheikh Iqbal Ahamed, editors, 47th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2023, Torino, Italy, June 26-30, 2023. pages 1167-1172, IEEE, 2023. [doi]
@inproceedings{DeAlcalaSMFO23,
title = {Measuring Bias in AI Models: An Statistical Approach Introducing N-Sigma},
author = {Daniel DeAlcala and Ignacio Serna and Aythami Morales and Julian Fiérrez and Javier Ortega-Garcia},
year = {2023},
doi = {10.1109/COMPSAC57700.2023.00176},
url = {https://doi.org/10.1109/COMPSAC57700.2023.00176},
researchr = {https://researchr.org/publication/DeAlcalaSMFO23},
cites = {0},
citedby = {0},
pages = {1167-1172},
booktitle = {47th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2023, Torino, Italy, June 26-30, 2023},
editor = {Hossain Shahriar and Yuuichi Teranishi and Alfredo Cuzzocrea and Moushumi Sharmin and Dave Towey and A. K. M. Jahangir Alam Majumder and Hiroki Kashiwazaki and Ji-Jiang Yang and Michiharu Takemoto and Nazmus Sakib and Ryohei Banno and Sheikh Iqbal Ahamed},
publisher = {IEEE},
isbn = {979-8-3503-2697-0},
}