Robert Neal Dean, Abby Anderson, Stanley J. Reeves, George T. Flowers, Alan Scottedward Hodel. Electrical Noise in MEMS Capacitive Elements Resulting From Environmental Mechanical Vibrations in Harsh Environments. IEEE Transactions on Industrial Electronics, 58(7):2697-2705, 2011. [doi]
@article{DeanARFH11,
title = {Electrical Noise in MEMS Capacitive Elements Resulting From Environmental Mechanical Vibrations in Harsh Environments},
author = {Robert Neal Dean and Abby Anderson and Stanley J. Reeves and George T. Flowers and Alan Scottedward Hodel},
year = {2011},
doi = {10.1109/TIE.2010.2076310},
url = {http://dx.doi.org/10.1109/TIE.2010.2076310},
researchr = {https://researchr.org/publication/DeanARFH11},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {58},
number = {7},
pages = {2697-2705},
}