Nilmoni Deb, Ronald D. Blanton. Analysis of failure sources in surface-micromachined MEMS. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 739-749, IEEE Computer Society, 2000.
@inproceedings{DebB00,
title = {Analysis of failure sources in surface-micromachined MEMS},
author = {Nilmoni Deb and Ronald D. Blanton},
year = {2000},
tags = {points-to analysis, analysis, source-to-source, open-source},
researchr = {https://researchr.org/publication/DebB00},
cites = {0},
citedby = {0},
pages = {739-749},
booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000},
publisher = {IEEE Computer Society},
}