Built-In Self Test of CMOS-MEMS Accelerometers

Nilmoni Deb, R. D. (Shawn) Blanton. Built-In Self Test of CMOS-MEMS Accelerometers. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 1075-1084, IEEE Computer Society, 2002. [doi]

Authors

Nilmoni Deb

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R. D. (Shawn) Blanton

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