Empirical bounds on fault coverage loss due to LFSR aliasing

Warren H. Debany Jr., Mark Gorniak, Daniel Daskiewich, Anthony R. Macera, Kevin A. Kwiat, Heather B. Dussault. Empirical bounds on fault coverage loss due to LFSR aliasing. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 143-148, IEEE, 1992. [doi]

Abstract

Abstract is missing.