Effect of the optical power and active layer thickness on the photocurrent in metal-semiconductor-metal detectors

Nacer Amara Debbar, Ahmed A. Telba, Majeed Alkanhal. Effect of the optical power and active layer thickness on the photocurrent in metal-semiconductor-metal detectors. In Proceedings of the 2003 10th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2003, Sharjah, United Arab Emirates, December 14-17, 2003. pages 762-765, IEEE, 2003. [doi]

Abstract

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