Stijn Decubber, Thomas Mortier, Krzysztof Dembczynski, Willem Waegeman. Deep F-Measure Maximization in Multi-label Classification: A Comparative Study. In Michele Berlingerio, Francesco Bonchi, Thomas Gärtner, Neil Hurley, Georgiana Ifrim, editors, Machine Learning and Knowledge Discovery in Databases - European Conference, ECML PKDD 2018, Dublin, Ireland, September 10-14, 2018, Proceedings, Part I. Volume 11051 of Lecture Notes in Computer Science, pages 290-305, Springer, 2018. [doi]
@inproceedings{DecubberMDW18, title = {Deep F-Measure Maximization in Multi-label Classification: A Comparative Study}, author = {Stijn Decubber and Thomas Mortier and Krzysztof Dembczynski and Willem Waegeman}, year = {2018}, doi = {10.1007/978-3-030-10925-7_18}, url = {https://doi.org/10.1007/978-3-030-10925-7_18}, researchr = {https://researchr.org/publication/DecubberMDW18}, cites = {0}, citedby = {0}, pages = {290-305}, booktitle = {Machine Learning and Knowledge Discovery in Databases - European Conference, ECML PKDD 2018, Dublin, Ireland, September 10-14, 2018, Proceedings, Part I}, editor = {Michele Berlingerio and Francesco Bonchi and Thomas Gärtner and Neil Hurley and Georgiana Ifrim}, volume = {11051}, series = {Lecture Notes in Computer Science}, publisher = {Springer}, isbn = {978-3-030-10925-7}, }