Stijn Decubber, Thomas Mortier, Krzysztof Dembczynski, Willem Waegeman. Deep F-Measure Maximization in Multi-label Classification: A Comparative Study. In Michele Berlingerio, Francesco Bonchi, Thomas Gärtner, Neil Hurley, Georgiana Ifrim, editors, Machine Learning and Knowledge Discovery in Databases - European Conference, ECML PKDD 2018, Dublin, Ireland, September 10-14, 2018, Proceedings, Part I. Volume 11051 of Lecture Notes in Computer Science, pages 290-305, Springer, 2018. [doi]
Abstract is missing.