HMM-Based Joint Modeling of Condition Monitoring Signals and Failure Event Data for Prognosis - researchr publication authors

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Akash Deep, Shiyu Zhou, Dharmaraj Veeramani, Yong Chen. HMM-Based Joint Modeling of Condition Monitoring Signals and Failure Event Data for Prognosis. IEEE Transactions on Reliability, 72(3):878-888, September 2023. [doi]

This author has not been identified. Look up 'Akash Deep' in GoogleThis author has not been identified. Look up 'Shiyu Zhou' in GoogleThis author has not been identified. Look up 'Dharmaraj Veeramani' in GoogleThis author has not been identified. Look up 'Yong Chen' in Google

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