HMM-Based Joint Modeling of Condition Monitoring Signals and Failure Event Data for Prognosis

Akash Deep, Shiyu Zhou, Dharmaraj Veeramani, Yong Chen. HMM-Based Joint Modeling of Condition Monitoring Signals and Failure Event Data for Prognosis. IEEE Transactions on Reliability, 72(3):878-888, September 2023. [doi]

Abstract

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